M210/M211

Voltage Transformer Test Set

Voltage Transformer Test Set M210/M211 uses a high-voltage capacitance bridge method to deliver unmatched accuracy in measuring voltage transformer errors across continuous primary and secondary voltage ranges. By replacing bulky traditional designs, this technology provides reduced equipment size and weight for effortless field operation.
Voltage Transformer Test Set M210/M211 can also serve as a high-voltage capacitance bridge to measure capacitance and dissipation factor (tan δ) during high-voltage equipment testing*

 

* Additional function. Can be supplied upon customer’s request

FEATURES AND BENEFITS

  • Measurement of voltage transformer errors in continuous ranges of primary and secondary voltages
  • High measurement accuracy (VTTS mode):
    up to ±0,005 % (ε) and ±0,3 min (Δφ)
  • High measurement accuracy (HVB mode):
    up to ±0,005 % (Cx) and ±0,00005 (tan δx)*
  • Measurement of true RMS values of primary and secondary voltages, THD, and n-th harmonic ratios (up to the 40th)
  • A more cost-effective solution than combining standard voltage transformers or voltage divider and comparator
  • Easy operation and handling
  • Compact size and low weight

 

 

APPLICATIONS

Voltage Transformer Test Set M210/M211 is used by:

  • Manufacturers of Voltage Transformers
  • On-site Voltage Transformer testing
  • Calibration Laboratories
  • Metrology Institutes

 

VERSIONS

Voltage Transformer Test Set M210/M211 is available in multiple versions, varying by accuracy class and maximum primary voltage. More details of the M210/M211 versions are given in the tables of technical ranges of primary and secondary voltages.

M210/M211 version* Primary voltage range (Up), kV Secondary voltage range (Us), V Rated voltage of High Voltage Capacitors (UCH), kV
M210.1 0,01…45* 0,6…1000 45
M211.1
M210.2 0,01…100* 100
M211.2
M210.3 0,01…230* 230
M211.3

* The version of M210/M211 for other primary voltage can be supplied upon customer’s request.

TEST ARRANGEMENT

VTTS mode

HVB mode (additional function)

Measurement ranges and error limits of Voltage Transformer Test Set M210 – VTTS mode

Value Range Absolute error

Additional conditions

Ratio error, ε

– 100 ≤ ε ≤ 100 %

± 0,015 % |∆φ| ≤ 100 min 300 V ≤ UP ≤ UСH,

6 ≤ US  ≤ 1000 V

± 0,05 %

|∆φ| ≤ 100 min 100 ≤ UP < 300 V,

6 ≤ US  ≤ 1000 V

± 0,1 %

|∆φ| > 100 min 100 V ≤ UP ≤ UСH,

6 ≤ US ≤ 1000 V

± 0,5 %

10 ≤ UP < 100 V and/or 0,6 ≤ US< 6 V

Phase displacement, ∆φ

– 300 ≤ ∆φ ≤ 300 min

± 1 min

|∆φ| ≤ 100 min 300 V ≤ UP ≤ UСH,

6 ≤ US ≤ 1000 V

± 3 min |∆φ| ≤ 100 min

100 ≤ UP < 300 V,

6 ≤ US ≤ 1000 V

± 5 min

|∆φ| > 100 min 100 V ≤ UP ≤ UСH,

6 ≤ US ≤ 1000 V

± 10 min

10 ≤ UP < 100 V and/or 0,6 ≤ US < 6 V

Relative value of secondary voltage, Us/Usr

2…190 %

± 1 %*

0,6 ≤ US ≤ 1000 V

Test voltage frequency, f

49…51 Hz** ± 0,02 Hz

–

Measurement ranges and error limits of Voltage Transformer Test Set M211 – VTTS mode

Value

Range Absolute error

Additional conditions

Ratio error, ε -100 ≤ ε ≤ 100 %

± 0,005 %

|∆φ| ≤ 30 min 300 V ≤ UP  ≤ UСH,

6 ≤ US ≤ 1000 V

± 0,01 %

30 < |∆φ| ≤ 100 min

± 0,05 %

|∆φ| ≤ 100 min

100 ≤ UP < 300 V,

6 ≤ US ≤ 1000 V

± 0,1 %

|∆φ| > 100 min

± 0,5 %

10 ≤ UP < 100 V and/or 0,6 ≤ US < 6 V

Phase displacement, ∆φ

-300 ≤ ∆φ ≤ 300 min

± 0,3 min |∆φ| ≤ 30 min 300 V ≤ UP ≤ UСH,

6 ≤ US ≤ 1000 V

± 1 min

30 < |∆φ| ≤ 100 min

± 3 min

|∆φ| ≤ 100 min

100 ≤ UP < 300 V,

6 ≤ US ≤ 1000 V

± 5 min

|∆φ| > 100 min

100 V ≤ UP ≤ UСH,

6 ≤ US ≤ 1000 V

± 10 min

10 ≤ UP < 100 V and/or 0,6 ≤ US < 6 V

Relative value of secondary voltage, US/USr

2…190 % ± 1 %*

0,6 ≤ US ≤ 1000 V

Test voltage frequency, f

49…51 Hz**

± 0,02 Hz

–

 

Measurement ranges and error limits of Voltage Transformer Test Set M210 –  HVB mode

Range

Relative error of δC, % Absolute error of dissipation factor Δtan δ

Test current, А

Сx/С0

tan δx

0,01…0,1

0…1 ±[1∙10-2 +2∙10-4∙(C0/Cx – 10) + |tan δx – tan δ0|] ±[1∙10-4 + 2∙10-6∙(C0/Cx -10) + 0,005∙|tan δx – tan δ0|] Up to 0,2

0,1…103

0…1

±1∙10-2 + |tan δx – tan δ0|]

±[1∙10-4 + 0,005∙|tan δx – tan δ0|]

 

Measurement ranges and error limits of Voltage Transformer Test Set  M211 –  HVB mode

Range

Relative error of δC, % Absolute error of dissipation factor Δtan δ

Test current, А

Сx/С0

tan δx

0,01…0,1

0…1 ±[5∙10-3 + 2∙10-4∙(C0/Cx – 10) + |tan δx – tan δ0|] ±[5∙10-5 + 2∙10-6∙(C0/Cx – 10) + 0,005∙| tan δx – tan δ0|]

Up to 0,2

0,1…103

0…1 ±5∙10-3 + |tan δx – tan δ0|]

±[5∙10-5 + 0,005∙|tan δx – tan δ0|]

 

Measurement ranges and error limits of Voltage Transformer Test Set M210/M211 – voltage parameters testing

Value

Range Error limits

Additional conditions

Effective voltage, V UP

300…UСH

  ± 0,5 %  (δU)

–

US

6…1000

Effective value of the first harmonic voltage, V UP1

300…UСH

 ± 0,5 % (δU)

–

US1

6…1000

Voltage waveform distortion factor at the input UP (THDUp), %

0…20 %

 ± 0,2 %  (ΔTHDUp) At THDUp < 2
 ± 10 %  (δTHDUp)

At THDUp ≥ 2

Voltage waveform distortion factor at the input US (THDUs), %

0…20 %

 ± 0,2 %  (ΔTHDUs) At THDUs < 2
± 10 %  (δTHDUs)

At THDUs ≥ 2

Coefficient of n-th voltage harmonic component at the input UP (THDUp(n)), %

0…15 %

 ± 0,05 %  (ΔTHDUp(n))

At THDUp(n) < 1
± 5 % (δTHDUp(n))

At THDUp(n) ≥ 1

Coefficient of n-th voltage harmonic component at the input US (THDUs(n)), %

0…15 %

 ± 0,05 % (ΔTHDUs(n))

At THDUs(n) < 1
± 5 %  (δTHDUs(n))

At THDUs(n) ≥ 1

Frequency, f

49…51 Hz* ± 0,02

–

Power mains
Measuring Unit built-in rechargeable battery
Charging and Calibration Power Supply Units 220/230 V, 50 Hz
Operating temperature -10…40 °C
Relative humidity up to 80 % non-condensing
Size (W × H × D) Measuring Unit 250 × 185 × 350 mm
         (d × H)

 

HVC50**

HVC100**

HVC300**

230 × 480 mm

375 × 740 mm

750 × 2065 mm

Weight, less than Measuring Unit

HVC50**

HVC100**

HVC300**

10,5 kg

15 kg

38 kg

175 kg

Standards

Safety

EMC

 

EN 61010-1:2010/A1:2019/AC:2019-04

EN 61326-1:2013

*Relative error.

**Measuring at the frequency of range 48…62 Hz can be agreed with the customer.

***The manufacturer reserves the right to change the characteristics of the device.

 

 

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