Voltage Transformer Test Set M120
Voltage Transformer Test Set M120 measures voltage transformer (VT) errors by comparing the primary voltage, which is scaled by the primary voltage converter, and the secondary voltage of the VT under test. The primary voltage converter is a component of the M120 and can be implemented on the basis of a capacitive divider or a reference voltage transformer.
FEATURES AND BENEFITS
- Test for accuracy:
- inductive VT
- capacitive VT
- low-power VT (LPVT)
- voltage sensor
- VT testing according to: IEC 61869-3, IEC 61869-5, IEC 61869-11, IEEE C57.13, IEC 60044-2, IEC 60044-5, IEC 60044-7
- VT testing with any ratio
- Short measurement time
- Measurement of primary and secondary voltages, THD measurement
- Integrated 7″ capacitive touch screen
- PC control via RS232 serial port
- Test voltage up to 520 kV
- Optional inclusion two high voltage capacitors for different maximum voltages in the set (determined when ordering)
- Easy handling
- Small size and low weight
APPLICATIONS M120 is used by:
- Voltage Transformers manufacturers
- On-site testing of Voltage Transformers
- Calibration laboratories
CONTROL FROM THE BUILT-IN SCREEN 
On the front panel there is a 7″ capacitive touch screen, as well as duplicate control buttons and an encoder. The interface is intuitive and easy to use. Measurement results are stored in memory and can be copied to a USB flash drive.
PC CONTROL
Specialized software “VT Test” is designed to automate the VT testing process.
VT Test software features: – Generation of transformer test cards, which include information about the transformer type, its characteristics and the test program; – Control of the transformer test process; – Analysis of the measurement results for compliance with the specified accuracy class; – Output results in tabular and graphical form; – Saving and viewing measurement results in the database in the form of reports; – Exporting reports from the database to Microsoft Word and Microsoft Excel files; – Creation of custom report templates Full automation of the testing process is achieved when using OLTEST equipment: – Electronic Voltage Burden М410 or М411; – Voltage Regulator R100 or R200; – Test Voltage Transformers G740, G770
Measurement ranges and absolute error limits of VT Test Set M120 with capacitive divider
| Value | Range | Resolution | Accuracy* |
Additional conditions |
| Ratio error ε |
–100…100 % |
0,001 % |
± 0,04 % |
100 V ≤ UP ≤ UPmax** 5 V ≤ US ≤ 500 V 0,1 V ≤ ULPVT ≤ 10 V*** |
|
0,01 % |
± 0,1 % | 10 V ≤ UP < 100 V 0,5 V ≤ US < 5 V 0,01 V ≤ ULPVT ≤ 0,1 V | ||
| Phase displacement Δφ |
–300…300 min |
0,1 min |
± 2 min |
100 V ≤ UP ≤ UPmax** 5 V ≤ US ≤ 500 V 0,1 V ≤ ULPVT ≤ 10 V*** |
| 0,1 min | ± 5 min |
10 V ≤ UP < 100 V 0,5 V ≤ US < 5 V 0,01 V ≤ ULPVT < 0,1 V*** |
||
|
Primary voltage UP |
0…UPmax | 10 mV | ± (0,5 % rdg + 50 mV) |
– |
| Secondary voltage US |
0…500 V |
0,1 mV | ± (0,5 % rdg + 0,5 mV) |
– |
| Secondary voltage ULPVT*** |
0…10 V |
0,01 mV | ± (0,5 % rdg + 0,02 mV) |
– |
| Frequency f |
48…62 Hz |
0,001 Hz | ± 0,02 Hz |
0,5 V ≤ US ≤ 500 V 0,01 V ≤ ULPVT ≤ 10 V*** |
| Total harmonic distortions THDP, THDS | 0…20 % | 0,01 % | ± (0,5 % rdg + 0,1 %) |
10 V ≤ UP ≤ UPmax** 0,5 V ≤ US ≤ 500 V 0,01 V ≤ ULPVT ≤ 10 V*** |
* Specified error limits are valid for the ambient temperature range from 0 to 40 °C. For the temperature range below 0 °C within the operating temperature range the error limits are doubled. ** UPmax is the maximum value of the primary voltage determined by the maximum voltage of the High Voltage Capacitor CH1 or CH2 used in the circuit. *** For M120.2 only.
| Power mains | |
| Rated Voltage Rated Frequency | 100…240 V 50/60 Hz |
| Operating conditions | |
| Temperature | –15…40 °C |
| Relative humidity | up to 80 % non-condensing |
| Technical parameters | |
| Size (Measuring unit) (W×H×D) | 370 × 460 × 150 mm |
| Weight (Measuring unit) | 8 kg |
| Standards | |
| Safety | EN 61010-1:2010/A1:2019/AC:2019-04 |
| EMC | EN IEC 61326-1:2021 |
* The manufacturer reserves the right to change the characteristics of the device.
